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Proceedings of the 16th Internationa...

International Conference on Defects in Semiconductors (1991 :)

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Proceedings of the 16th International Conference on Defects in Semiconductors : = ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Proceedings of the 16th International Conference on Defects in Semiconductors :/ edited by Gordon Davies, Gary G. DeLeo and Michael Stavola.
其他題名:	ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 /
團體作者:	International Conference on Defects in Semiconductors
出版者:	Zurich, Switzerland ;Trans Tech Publications, : c1992.,
面頁冊數:	3 v. (1604 p.) :ill. ;25 cm.
附註:	Cover title: Defects in semiconductors 16.
叢書名:	Materials science forum,
標題:	Semiconductors - Defec -
ISBN:	0878496289 (set : pbk.) :
ISSN:	0255-5476

Proceedings of the 16th International Conference on Defects in Semiconductors : = ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 /
Proceedings of the 16th International Conference on Defects in Semiconductors :ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 /edited by Gordon Davies, Gary G. DeLeo and Michael Stavola. - Zurich, Switzerland ;Trans Tech Publications,c1992. - 3 v. (1604 p.) :ill. ;25 cm. - Materials science forum,v. 83-870255-5476 ;.

Cover title: Defects in semiconductors 16.

Includes bibliographical references and index.

ISBN: 0878496289 (set : pbk.) :SFr520.00

ISSN: 0255-5476Subjects--Topical Terms:

650436
Semiconductors
--Defec

LC Class. No.: QC611.6.D4 / I575 1991

Dewey Class. No.: 537.622 / In834p, 1991

Proceedings of the 16th International Conference on Defects in Semiconductors : = ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 /
LDR:00882nam a2200205 a 45 001 643792
003 OCoLC
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008 920225s1992 sz a b 101 0 eng d
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022 $a 0255-5476
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050 $a QC611.6.D4 $b I575 1991
082 $a 537.622 $b In834p, 1991
111 $a International Conference on Defects in Semiconductors $n (16th : $d 1991 : $c Bethlehem, Pa.) $3 650435
245 1 0 $a Proceedings of the 16th International Conference on Defects in Semiconductors : $b ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 / $c edited by Gordon Davies, Gary G. DeLeo and Michael Stavola.
260 $a Zurich, Switzerland ; $a Brookfield, VT, USA : $c c1992. $b Trans Tech Publications,
300 $a 3 v. (1604 p.) : $b ill. ; $c 25 cm.
440 0 $a Materials science forum, $x 0255-5476 ; $v v. 83-87
500 $a Cover title: Defects in semiconductors 16.
504 $a Includes bibliographical references and index.
650 $a Semiconductors $x Defec $3 650436