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Frontiers in electronics = advanced ...
~
I�niguez, Benjamin.
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Frontiers in electronics = advanced modeling in nanoscale electron devices /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Frontiers in electronics/ editors, Benjamin I�niguez, Tor A. Fjeldly.
Reminder of title:
advanced modeling in nanoscale electron devices /
other author:
I�niguez, Benjamin.
Published:
Singapore :World Scientific, : 2014.,
Description:
1 online resource (204 p.).
Subject:
Nanoelectronics. -
Online resource:
http://www.worldscientific.com/worldscibooks/10.1142/9077#t=toc
ISBN:
9789814583190 (electronic bk.)
Frontiers in electronics = advanced modeling in nanoscale electron devices /
Frontiers in electronics
advanced modeling in nanoscale electron devices /[electronic resource] :editors, Benjamin I�niguez, Tor A. Fjeldly. - Singapore :World Scientific,2014. - 1 online resource (204 p.). - Selected topics in electronics and systems ;v. 54. - Selected topics in electronics and systems ;v. 51..
Includes bibliographical references and index.
This book consists of four chapters to address at different modeling levels for different nanoscale MOS structures (Single- and Multi-Gate MOSFETs). The collection of these chapters in the book are attempted to provide a comprehensive coverage on the different levels of electrostatics and transport modeling for these devices, and relationships between them. In particular, the issue of quantum transport approaches, analytical predictive 2D/3D modeling and design-oriented compact modeling. It should be of interests to researchers working on modeling at any level, to provide them with a clear exp.
ISBN: 9789814583190 (electronic bk.)
LCCN: 2015413758Subjects--Topical Terms:
898422
Nanoelectronics.
LC Class. No.: TK7874.84 / .F76 2014
Dewey Class. No.: 620.5
Frontiers in electronics = advanced modeling in nanoscale electron devices /
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editors, Benjamin I�niguez, Tor A. Fjeldly.
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Includes bibliographical references and index.
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This book consists of four chapters to address at different modeling levels for different nanoscale MOS structures (Single- and Multi-Gate MOSFETs). The collection of these chapters in the book are attempted to provide a comprehensive coverage on the different levels of electrostatics and transport modeling for these devices, and relationships between them. In particular, the issue of quantum transport approaches, analytical predictive 2D/3D modeling and design-oriented compact modeling. It should be of interests to researchers working on modeling at any level, to provide them with a clear exp.
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http://www.worldscientific.com/worldscibooks/10.1142/9077#t=toc
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