Characterization in silicon processing /
Strausser, Yale.

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  • Characterization in silicon processing /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Characterization in silicon processing // editor, Yale Strusser ; contributing editors, C.R. Brundle, Gary E. McGuire ; managing editor, Lee E. Fitzpatrick.
    other author: Strausser, Yale.
    Published: Boston :Butterworth-Heinemann ; : c1993.,
    Description: xiii, 240 p. :ill. ;25 cm.
    Series: Materials characterization series
    Subject: Electric conductors. -
    ISBN: 0750691727
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  • 1 records • Pages 1 •
 
W0024785 罕用書庫221室(美崙校區,調書請點預約)(RU_221) 01.外借(書)_YB 一般圖書 QC611.8.S5 C469 1993 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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